Hi Philipp,
The logic area can be auto-generated (but questionable if it worths, as this needs to be done only once :) ).
For the pad generation, vias need to be spread all over the surface of the pad, and vias on successive layers shall be offset from each other (like a chessboard). Otherwise, the topmost metal layer may delaminate during encapsulation (due to the mechanical shear stress caused by the thermosetting process).
For the output stage transistors: librarian is already capable of generating them (including ESD-tailored features, like increased resistance in drain for current equalization).
Unfortunately, as Staf wrote, ESD performance cannot be estimated using simulation. We will have to design a test chip with several candidates, test it for HBM exposure, then do the failure analysis and decide how it failed and how to improve. I already have a proposal for the test chip for pad cell validation, I just have to properly document it.
Regards,
Ferenc