Hagen, I did not look carefully enough and thought all metal1 was shorted between center ground pin and the other pins.I know principle of 4- point measurement also called force/sense. I have problem figuring out how it is applicable to this design. Could you give example for one of the structures which pads are used for force and which for sense ?You may not be able to simulate structure exactly but you can use some assumed values to see if measurement procedure will actually work. Best to include all (parasitic) junctions in such simulation. Speaking from experience they often can cause problems when sharing pins when they are unwanted biased in forward. greets,Staf. Hagen SANKOWSKI schreef op vr 03-08-2018 om 14:48 [+0200]:
Hello Staf.
Yes, the L500_MOSFET_aligning MOSFET-like structure shares the same Ground-Pad in the middle. And, the PAD which drives the Poly-Gate on the MOSFET-like structure is also shared with a DRAIN-/SOURCE-stripe.
If you look deeper into the structure (which I adapt from a german textbook [0]), you see that the DRAIN- and SOURCE stripe is shorted to one contact. So, the structure looks similar to a MOSFET transistor, but it isn't, and can not work as a transistor. We like to
- see how good align we can different mask (esp. needed for
MOSFETS), therefor they are rotated by 90 degree.
- measure long, long nimplant/pimplant stripes (150 um long, with
minimal GATE-size of 1 um) for resistance.
- measure, if the Mask alignment is not so perfect, how this impacts
the nimplemant/pimplemant resistance.
BTW, between shared PADs, the internal structure looks like a Resistor (the DRAIN-/SOURCE-stripes on one MOSFET-like structure) in parallel to Capacitor (the long Poly-Si GATE stripe of another MOSFET-like structure).
Regarding your concern, we like to measure with a 4-pin needle probe. So, usually we stimulate two PADs with current / voltage and measure on both others current / voltage. My expectation is, that there are no trigger for latch-up or other parasitic effects. And, currently, we can not simulate the structures as we are missing the first values. After measuring resistance and capacitance, we get the values for the BSIM3v3 Spice-Modell and can simulate more productive structures.
And yes, I am aware of my duty to document all thoughts around the test structures :-)
Regards, Hagen.
[0] https://www.amazon.de/Proze%C3%9Ftechnologie-Fertigungsverfahren-Integrier te-Mos-Schaltungen-Mikroelektronik/dp/3540176705
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Am 03.08.2018 13:28 schrieb Staf Verhaegen:
Hello,
I had a quick look at the current PearlRiver design(s). I also see layout not schematics or netlists. Do you plan to simulatie your measurement procedures before actually manufacturing the wafer ?
Normal design procedure for analog (test) circuits is first do schematic capture, simulate the test procedure and then make layout according to schema and make it LVS (layout-versus-schematic) clean.
Specifically for the L500_MOSFET_aligning structure which is indicated to also be used for measuring resistance and capacitance. To save pins I see a lot of pins are shared. For example I see that the middle pin is both connected to NWELL as to PSUB/PWELL which seems dangerous to me. In general I see that almost all of the pins are in one way connected to NWELL or PSUB/PWELL and basically shorted with other pins through these wells and also metal1. So I am wondering which resistances you actually try to measure here.
greets, Staf.
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